Fundamentals of Metrology and Characterization for Nano

Friday, September 27, 2013

Metrology (formally the science of measurement) is a key aspect of nanotechnology. The ability to characterize a surface, a property, or a material at the nanoscale is critical to product performance. Professional technicians working in nanotechnology areas should be grounded in the fundamentals of metrology. In this webinar Dr. Diane Hickey-Davis a respected scientist and product expert, will share her knowledge of five common types of metrology equipment, how industry uses it in practice, and what students and technicians should know and be able to do when measuring on this scale. She will describe how you know what you are looking at, reinforce the basic science concepts, and detail the capabilities and limitations of the techniques.